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Project Details

High-Temperature Operating Life (HTOL) Tester

  • Non-volatile memory
    I2C, SPI, proprietary protocols
  • In-situ tested
    Checkerboard pattern, Continuous reads, Logged error results
  • Mixed signal I/O
    AO for high level output settings, DIO for buffered pattern I/O
  • 2048 parts per test
    Up from 80 parts per test

Microchip leveraged PXI with C/C++ based code to improve density and reliability testing for serial EEPROM and Crypto memory products. The scalable architecture is expandable and provides real time verification resulting in unparalleled test confidence.

  • Category:Industrial
  • Client:Microchip

About Solubit

Your partner for all things test, measurement, and control. At Solubit, we offer a complete menu of integrated hardware/software solutions that can be tailored to your specific and unique requirements. From simulation to characterization to validation to production and automation, we have the expertise to develop turnkey solutions or simply augment your existing team and everything in between. We listen, we anticipate, and we collaborate with a goal of providing exactly the right level engagement needed to ensure your success.